Cher Ming Tan
Books
- Theory and Practice of Quality and Reliability Engineering in Asia Industry
- Electromigration in Ulsi Interconnections
- Reliability and Failure Analysis of High Power LED Packaging
- Reliability Analysis of Electrotechnical Devices
- Graphene and VLSI Interconnects
- Electromigration Modeling at Circuit Layout Level
- Graphene and Ulsi Interconnects
- Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Author data: Open Library