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Cover of Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

by Krishnendu Chakrabarty, Sandeep K. Goel

Metal oxide semiconductors, complementaryNanotechnologyComplementary Metal oxide semiconductorsTestingMOS complémentairesEssaisTECHNOLOGY & ENGINEERINGMechanical
Writing a summary for young readers…

For young readers

Book data: Open Library