Testing and Testable Design of High-Density Random-Access Memories

Testing and Testable Design of High-Density Random-Access Memories deals with the study of fault modeling, testing and testable design of semiconductor random-access memories. It is written primarily for the practising design engineer and the manufacturer of random-access memories (RAMs) of the modern age. It provides useful exposure to state-of-the-art testing schemes and testable design approaches for RAMs. It is also useful as a supplementary text for undergraduate courses on testing and testability of RAMs. Testing and Testable Design of High-Density Random-Access Memories presents an integrated approach to state-of-the-art testing and testable design techniques for RAMs. These new techniques are being used for increasing the memory testability and for lowering the cost of test equipment. Semiconductor memories are an essential component of digital computers - they are used as primary storage devices. They are used in almost all home electronic equipment, in hospitals and for avionics and space applications. From hand-held electronic calculators to supercomputers, we have seen generations of memories that have progressively become smaller, smarter and cheaper. For the past two