IWSM
by International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii), IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers
SemiconductorsCongressesStatistical methodsCharacterizationMeasurementEngineering measurement & calibrationMathematics for scientists & engineersTechnology & Industrial Arts
Writing a summary for young readers…
For young readers
Book data: Open Library