Biometric Quality : the Last 1%
by Elham Tabassi, Patrick Grother, U. S. Department of Commerce National Institute of Standards and Technology (NIST)
Writing a summary for young readers…
For young readers
Book data: Open Library
by Elham Tabassi, Patrick Grother, U. S. Department of Commerce National Institute of Standards and Technology (NIST)
Book data: Open Library