P. S. Ho
Books
- Thin Films Vol. 54
- Diffusion phenomena in thin films and microelectronic materials
- Thin films
- Low dielectric constant materials for IC applications
- Materials Reliability Issues in Microelectronics
- Stress-induced phenomena in metallization
- Advanced interconnects for ULSI technology
- Stress-induced phenomena in metallization
- Stress-induced phenomena in metallization
- Stress induced phenomena in metallization
- Electronic packaging materials science VI
Author data: Open Library